1201 Cole Estates Dr

Georgetown, TX 78628

(979) 450 – 4960

Failure Analysis

Our laboratory provides comprehensive semiconductor failure analysis services using advanced electron microscopy and specialized diagnostic techniques.

Semiconductor Defect Analysis Services

When electronic components fail prematurely or behave unexpectedly, our expert analysis pinpoints the root cause—whether manufacturing defects, material degradation, counterfeit components, or design flaws. Our failure analysis incorporates non-destructive and destructive testing methods following industry standards, delivering detailed reports with actionable insights.

With our military-grade precision and AS6171-compliant methodologies, we transform component failures into opportunities for design improvement and risk mitigation.