Hitachi SU3500 Scanning Electron Microscope
The Hitachi SU3500 is a variable pressure scanning electron microscope that delivers exceptional 3nm resolution imaging at 30kV while offering the unique ability to observe non-conductive samples without coating in its extended vacuum range of 6-650 Pa. Its innovative features include real-time 3D imaging through Live Stereo SEM technology and the Ultra Variable-Pressure Detector (UVD) for optimized surface imaging.
Oxford X-MaxN Electron-Dispersive X-ray Spectrometer (EDS) System
The Oxford INCA system has a 10mm2 detector with 140eV resolution. The system can do basic elemental analysis as well as mapping, line scans and point/ area analysis off of an image. All the data can be exported to Word, or taken as raw data in the form of EMSA file.
Desk V Thin Film Deposition Solution
The Desk V deposits a broad range of coating materials (including iridium), while the adjustable rotating and tilting stage ensures a highly uniform coating with excellent conformity and coverage, even on samples with highly irregular surfaces. The Desk V includes an easy-to-change, drop-in style, insulated rotating specimen table, and its plug-and-play style eliminates much of the learning curve for you.
Ion Milling System ArBlade 5000
The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.
The ArBlade 5000 is equipped with a fast-milling Ar ion gun with a milling rate twice as high for cutting-edge performance, thus dramatically reducing the processing time for cross-section preparation.