The LabSight™ Difference
See why ion milling reveals what mechanical polishing conceals.
Sample preparation comparison shown above via Mechanical Polish on the left, and Ion Milled on the right.
Ion Milling does not induce relief pullout effects.
Flat milling shifts the beam off-center so that a wide area around the sample is uniformly milled.
In cross-section milling, the sample material protruding from the mask is milled away, leaving a pristine and polished sample.
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