Description
Using advanced electron beam technology, we identify and map the exact elements present in your samples with precision and confidence. Our SEM-EDS analysis provides:
- Detailed elemental composition of your materials
- High-resolution imaging down to the nanoscale
- Elemental mapping showing the distribution of components
- Quantitative analysis of element percentages
- Contamination identification for quality control
- Failure analysis to determine material breakdown causes
SEM-EDS is widely used in materials science, geology, archaeology, forensics, and many other fields to analyze the composition of materials, identify unknown substances, examine contamination, and study the distribution of elements within a sample.
